Technology Fair Demonstration Webinar - 8 sesji
8 zdalnych prezentacji firm Maury Microwave, AMCAD Engineering i Vertigo 14-17 czerwca
Po zakończeniu wszystkie prezentacje będą dostępne na żądanie
John Dominguez, Maury Microwave
Summary
Load Pull is the act of presenting a set of controlled impedances to a device under test (DUT) and measuring a set of parameters at each point. By varying the impedance, it is possible to fully characterize the performance of a DUT. The most common tool used to vary the impedance presented to a DUY is the passive impedance tuner. While the fundamental principles of passive impedance tuning haven’t changed significantly since their earliest conception, today’s state-of-the-art automated impedance tuners have improved accuracy and repeatability, are orders of magnitude faster, allow for direct user control, and are optimized for on-wafer measurements.
In this webinar, we will:
Monday, June 14, 17:00 CEDT
Register
Register Here
Dr. Jonas Urbonas, Maury Microwave
Summary
Vector receiver load pull, also referred to as real-time load pull, has become the preferred load pull methodology of the 2010s and 2020s. Vector receiver load pull replaces a traditional scalar power meter and spectrum analyzer with a vector receiver, such as a VNA. Instead of measuring powers and de-embedding to the DUT reference plane, this methodology uses low-loss couplers between the tuners and DUT to sample the a1, a2, b1 and b2 waves at the DUT reference plane to calculate delivered input power, output power, power gain and PAE. Advantages of this method include a general dynamic range improvement as well as empowering the measurement of AM/PM, large-signal input impedance, and the independent fundamental and harmonic powers and impedances.
In this webinar, we will:
Monday, June 14, 18:00 CEDT
Register
Register Here
Silvia Hernandez and Nicolas Labrousse, AMCAD Engineering
Summary
Get a full overview from pulsed IV measurements up to circuit design and MMIC stability analysis. A Key point for good models is the quality of the measurements and the right methodology to extract different behaviors. Following that, the amplifier's design is not finished until the stability analysis is done and validated.
In this webinar, we will:
Date and Time
Tuesday, June 15, 17:00 CEDT
Register
Register Here
Dr. Jonas Urbonas, Maury Microwave
Summary
During the initial stages of device technology development, timely feedback to device development engineers is important to accelerate the development process. Quickly and accurately benchmarking the performance of various semiconductor technologies using small periphery devices contributes to reducing development costs and expediting time to market. This can be achieved using hybrid-active vector receiver load-pull systems providing |ΓL| = 1 at the DUT reference plane at E- and W-Band frequencies. The measured vector a and b waves enable the characterization of various DUT parameters, such as delivered input power, output power, power gain and PAE that are not normally available from scalar measurements. This enables higher device characterization accuracy, facilitating more accurate device parameter extraction for better model fidelity.
In this webinar, we will:
Date and Time
Tuesday, June 15, 18:30 CEDT
Register
Register Here
Arnaud Delias, AMCAD Engineering
Summary
Linearity specs of Power Amplifiers using 5G wideband modulated signals is a "must-have" for RFPA designers. Although the characterization of the PA can be done using different Instruments available in the labs, the DPD evaluation on such RFPA is done using RFIC transceivers with an FPGA to mimic the base-station-like conditions as much as possible. Using IQSTAR, the designer can easily switch between benches and instruments to characterize the PA under multiple conditions.
In this webinar, we will:
Date and Time
Wednesday, June 16, 17:00 CEDT
Register
Register Here
Dr. Jonas Urbonas, Maury Microwave
Summary
Performing device characterization measurements at millimeter-wave and sub-THz frequencies can be challenging for several reasons. First, it’s difficult to achieve accurate and repeatable power-control at the DUT reference plane when using waveguide extenders between 110 GHz and 1.1 THz, as the extenders typically output a fixed power. However, controlling the power delivered to the input of the DUT is critical in setting the device’s operating conditions and characterizing its performance over power, such as the large-signal characteristic gain compression. Second, load pull, which means changing the load impedance presented to the DUT to an arbitrary non-50Ω value, is difficult as passive load pull impedance tuners are typically unavailable above 110 GHz, and even then, are limited in their ability to present high mismatches at the DUT reference plane. Load pull measurements are necessary for transistor designers to properly characterize and model the high-speed behaviors of their devices. For circuit designers, load pull measurements are used to determine the ideal matching conditions and optimize performance, at powers where every fraction of a dB is important. Load pull can also be used to test systems, such as new mm-wave radars, where both contacted and over-the-air performance testing is needed. Vertigo Technologies has overcome these challenges with its MMW-STUDIO mmW and Sub-THz Characterization Software and Vector Modulator Unit (VMU).
In this webinar, we will:
Date and Time
Wednesday, June 16, 18:30 CEDT
Register
Register Here
Wissam Saabe, AMCAD Engineering
Summary
Learn more about cutting-edge RF circuit behavioral modeling methodologies to simulate actual performances of complex RF Systems. Accurate behavioral models are the key to successful system integration. Models that handle complex phenomena like frequency memory effects and mismatched conditions are a must-have to design advanced 5G communication systems and active antenna arrays
In this webinar, we will:
Date and Time
Thursday, June 17, 17:00 CEDT
Register
Register Here
John Dominguez, Maury Microwave
Summary
When working with modulated signals, i.e. for 4G, 5G and WLAN applications, for a well-controlled linearity behavior of the DUT, the reflection coefficients offered to the DUT should ideally be constant (not vary versus frequency) within the modulation bandwidth at the fundamental, as well as in all related frequency bands at baseband and harmonic frequencies. This situation is approximated in real circuit implementations, where the matching networks are placed directly at the reference planes of the active device. In conventional load-pull setups, however, the actual physical impedance is always located at some distance from the DUT, which is much larger than for any practical matching network. This distance, as well as any physical length within the tuning element itself (such as the position of the probe in mechanical tuners), yields very large electrical delays causing rapid phase changes of the reflection coefficients versus frequency. It is clear that these large phase deviations represent nonrealistic circuit conditions and will cause measurement errors such as IM3 asymmetry, spectral re-growth and EVM degradation. In general, maintaining the reflection coefficients constant over frequency is getting more and more difficult with the increase in modulation bandwidth of communication signals, not only in practical circuits, but definitely in load pull measurement setups.
In this webinar, we will:
Date and Time
Thursday, June 17, 18:30 CEDT
Register
Register Here
Po zakończeniu wszystkie prezentacje będą dostępne na żądanie
- Session 1: An Introduction to Impedance Tuners
- Session 2: An Introduction to Vector Receiver Load Pull Measurements
- Session 3: From Transistor Measurements to MMIC Design - How to Reach First Pass Design Success Using IVCAD
- Session 4: High-Power High-Gamma Hybrid-Active Waveguide Load Pull Measurements at 50-110 GHz
- Session 5: Anticipate RF Power Amplifiers Performances with IQSTAR in base-station-like operation conditions
- Session 6: mmW and Sub-THz 50Ω Gain Compression and Active Load Pull Measurements
- Session 7: Simulate Realistic Communication Systems Performance Using VISION
- Session 8: Optimized Load Pull Measurements at 5G FR1 Frequencies using MT2000
Session 1: An Introduction to Impedance Tuners
SpeakerJohn Dominguez, Maury Microwave
Summary
Load Pull is the act of presenting a set of controlled impedances to a device under test (DUT) and measuring a set of parameters at each point. By varying the impedance, it is possible to fully characterize the performance of a DUT. The most common tool used to vary the impedance presented to a DUY is the passive impedance tuner. While the fundamental principles of passive impedance tuning haven’t changed significantly since their earliest conception, today’s state-of-the-art automated impedance tuners have improved accuracy and repeatability, are orders of magnitude faster, allow for direct user control, and are optimized for on-wafer measurements.
In this webinar, we will:
- Understand the motivations of performing load pull measurements.
- Learn how passive impedance tuners work (coaxial fundamental and harmonic, waveguide…).
- See a demonstration of state-of-the-art impedance tuner technology at 5G FR1 and FR2 frequencies.
Monday, June 14, 17:00 CEDT
Register
Register Here
Session 2: An Introduction to Vector Receiver Load Pull Measurements
SpeakerDr. Jonas Urbonas, Maury Microwave
Summary
Vector receiver load pull, also referred to as real-time load pull, has become the preferred load pull methodology of the 2010s and 2020s. Vector receiver load pull replaces a traditional scalar power meter and spectrum analyzer with a vector receiver, such as a VNA. Instead of measuring powers and de-embedding to the DUT reference plane, this methodology uses low-loss couplers between the tuners and DUT to sample the a1, a2, b1 and b2 waves at the DUT reference plane to calculate delivered input power, output power, power gain and PAE. Advantages of this method include a general dynamic range improvement as well as empowering the measurement of AM/PM, large-signal input impedance, and the independent fundamental and harmonic powers and impedances.
In this webinar, we will:
- Understand the motivations of performing load pull measurements.
- Learn how to configure a vector receiver load pull bench.
- See a demonstration of vector receiver load pull using a Maury Microwave XT-series automated impedance tuner, Maury/AMCAD IVCAD measurement and modeling device characterization software suite, and Copper Mountain Technologies’ Cobalt-series VNA.
Monday, June 14, 18:00 CEDT
Register
Register Here
Session 3: From Transistor Measurements to MMIC Design - How to Reach First Pass Design Success Using IVCAD
SpeakersSilvia Hernandez and Nicolas Labrousse, AMCAD Engineering
Summary
Get a full overview from pulsed IV measurements up to circuit design and MMIC stability analysis. A Key point for good models is the quality of the measurements and the right methodology to extract different behaviors. Following that, the amplifier's design is not finished until the stability analysis is done and validated.
In this webinar, we will:
- Guide you through good practices for Pulsed IV and S parameters measurements for GaN transistor compact model extraction.
- Use Load pull measurements for model validation under large-signal operating conditions.
- Design a PA using the extracted compact model and analyze its stability using STAN tool.
Date and Time
Tuesday, June 15, 17:00 CEDT
Register
Register Here
Session 4: High-Power High-Gamma Hybrid-Active Waveguide Load Pull Measurements at 50-110 GHz
SpeakerDr. Jonas Urbonas, Maury Microwave
Summary
During the initial stages of device technology development, timely feedback to device development engineers is important to accelerate the development process. Quickly and accurately benchmarking the performance of various semiconductor technologies using small periphery devices contributes to reducing development costs and expediting time to market. This can be achieved using hybrid-active vector receiver load-pull systems providing |ΓL| = 1 at the DUT reference plane at E- and W-Band frequencies. The measured vector a and b waves enable the characterization of various DUT parameters, such as delivered input power, output power, power gain and PAE that are not normally available from scalar measurements. This enables higher device characterization accuracy, facilitating more accurate device parameter extraction for better model fidelity.
In this webinar, we will:
- Understand the challenges of performing on-wafer load pull measurements at mmW frequencies.
- Learn how to configure a hybrid-active waveguide vector receiver load pull bench.
- See a demonstration of hybrid-active waveguide vector receiver load pull using a Maury Microwave waveguide automated impedance tuner, Maury/AMCAD IVCAD measurement and modeling device characterization software suite, and Keysight Technologies PNA-X VNA.
Date and Time
Tuesday, June 15, 18:30 CEDT
Register
Register Here
Session 5: Anticipate RF Power Amplifiers Performances with IQSTAR in base-station-like operation conditions
SpeakerArnaud Delias, AMCAD Engineering
Summary
Linearity specs of Power Amplifiers using 5G wideband modulated signals is a "must-have" for RFPA designers. Although the characterization of the PA can be done using different Instruments available in the labs, the DPD evaluation on such RFPA is done using RFIC transceivers with an FPGA to mimic the base-station-like conditions as much as possible. Using IQSTAR, the designer can easily switch between benches and instruments to characterize the PA under multiple conditions.
In this webinar, we will:
- Demonstrate fast and accurate IFBW measurements on a PA.
- Perform DPD performance evaluation on a PA using High-End instruments.
- Evaluate DPD Performance using COTS RFIC Transceiver Demo-Board and FPGA in a base-station-like operation condition.
Date and Time
Wednesday, June 16, 17:00 CEDT
Register
Register Here
Session 6: mmW and Sub-THz 50Ω Gain Compression and Active Load Pull Measurements
SpeakerDr. Jonas Urbonas, Maury Microwave
Summary
Performing device characterization measurements at millimeter-wave and sub-THz frequencies can be challenging for several reasons. First, it’s difficult to achieve accurate and repeatable power-control at the DUT reference plane when using waveguide extenders between 110 GHz and 1.1 THz, as the extenders typically output a fixed power. However, controlling the power delivered to the input of the DUT is critical in setting the device’s operating conditions and characterizing its performance over power, such as the large-signal characteristic gain compression. Second, load pull, which means changing the load impedance presented to the DUT to an arbitrary non-50Ω value, is difficult as passive load pull impedance tuners are typically unavailable above 110 GHz, and even then, are limited in their ability to present high mismatches at the DUT reference plane. Load pull measurements are necessary for transistor designers to properly characterize and model the high-speed behaviors of their devices. For circuit designers, load pull measurements are used to determine the ideal matching conditions and optimize performance, at powers where every fraction of a dB is important. Load pull can also be used to test systems, such as new mm-wave radars, where both contacted and over-the-air performance testing is needed. Vertigo Technologies has overcome these challenges with its MMW-STUDIO mmW and Sub-THz Characterization Software and Vector Modulator Unit (VMU).
In this webinar, we will:
- Understand the motivations of performing load pull measurements at mmW and sub-THz frequencies.
- Learn how to configure a sub-THz active load pull bench.
- See a demonstration of mmW and sub-THz active load pull using Vertigo Technologies vector modulator unit (VMU) and MMW-STUDIO mmW and Sub-THz Characterization Software, Rohde & Schwarz ZNA-series VNA, and MPI TS3000 probe station.
Date and Time
Wednesday, June 16, 18:30 CEDT
Register
Register Here
Session 7: Simulate Realistic Communication Systems Performance Using VISION
SpeakerWissam Saabe, AMCAD Engineering
Summary
Learn more about cutting-edge RF circuit behavioral modeling methodologies to simulate actual performances of complex RF Systems. Accurate behavioral models are the key to successful system integration. Models that handle complex phenomena like frequency memory effects and mismatched conditions are a must-have to design advanced 5G communication systems and active antenna arrays
In this webinar, we will:
- Demonstrate RF circuit behavioral model extraction using simulated and measured data.
- Simulate a large phased-array antenna system while considering RF front-ends behavior.
- Run a virtual DPD bench on an RFPA design minimizing ACPR regrowth caused by memory effects.
Date and Time
Thursday, June 17, 17:00 CEDT
Register
Register Here
Session 8: Optimized Load Pull Measurements at 5G FR1 Frequencies using MT2000
SpeakerJohn Dominguez, Maury Microwave
Summary
When working with modulated signals, i.e. for 4G, 5G and WLAN applications, for a well-controlled linearity behavior of the DUT, the reflection coefficients offered to the DUT should ideally be constant (not vary versus frequency) within the modulation bandwidth at the fundamental, as well as in all related frequency bands at baseband and harmonic frequencies. This situation is approximated in real circuit implementations, where the matching networks are placed directly at the reference planes of the active device. In conventional load-pull setups, however, the actual physical impedance is always located at some distance from the DUT, which is much larger than for any practical matching network. This distance, as well as any physical length within the tuning element itself (such as the position of the probe in mechanical tuners), yields very large electrical delays causing rapid phase changes of the reflection coefficients versus frequency. It is clear that these large phase deviations represent nonrealistic circuit conditions and will cause measurement errors such as IM3 asymmetry, spectral re-growth and EVM degradation. In general, maintaining the reflection coefficients constant over frequency is getting more and more difficult with the increase in modulation bandwidth of communication signals, not only in practical circuits, but definitely in load pull measurement setups.
In this webinar, we will:
- Understand the motivations of performing load pull measurements.
- Learn how mixed-signal active load pull works.
- See a demonstration of high-speed CW/pulsed-CW harmonic active load pull at 5G FR1 frequencies.
- See a demonstration of wideband impedance control for modulated signals at 5G FR1 frequencies.
Date and Time
Thursday, June 17, 18:30 CEDT
Register
Register Here
